ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,986, issued on Feb. 24, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Chassis-based storage device with dual-end slidin... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,563,109, issued on Feb. 24, was assigned to VOXSMART Ltd. (London). "Computer-programmed telephone-enabled devices for processing and managing ... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,547, issued on Feb. 24, was assigned to VenaResources Inc. (Plano, Texas). "Recessable RFID fastener" was invented by Jonathan M. Butler (G... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,573, issued on Feb. 24, was assigned to NGK INSULATORS Ltd. (Nagoya, Japan). "Gas sensor and control method of gas sensor" was invented by ... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,559,704, issued on Feb. 24, was assigned to Entegris Inc. (Billerica, Mass.). "Microelectronic device cleaning composition" was invented by Eli... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,563,755, issued on Feb. 24, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Atsugi, Japan). "Semiconductor device and manufacturing m... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,296, issued on Feb. 24, was assigned to LG INNOTEK CO LTD. (Seoul, South Korea). "Lighting apparatus and automotive lamp comprising same" w... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,148, issued on Feb. 24, was assigned to Oracle International Corp. (Redwood Shores, Calif.). "Automated compatibility assessment and migrat... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,453, issued on Feb. 24, was assigned to Gwangju Institute of Science and Technology (Gwangju, South Korea). "Pedestrian trajectory predicti... और पढ़ें
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,335, issued on Feb. 24, was assigned to Hitachi High-Tech Corp. (Tokyo). "Sample inspection apparatus, inspection system, thin piece sample... और पढ़ें